INL/DNL Measurements for High-Speed Analog-to-Digital Converters (ADCs) - Tutorial - Maxim

ثبت نشده
چکیده

Although integral and differential nonlinearity may not be the most important parameters for high-speed, high dynamic performance data converters, they gain significance when it comes to highresolution imaging applications. The following application note serves as a refresher course for their definitions and details two different, yet commonly used techniques to measure INL and DNL in highspeed analog-to-digital converters (ADCs). Manufacturers have recently introduced high-performance analog-to-digital converters (ADCs) that feature outstanding static and dynamic performance. You might ask, "How do they measure this performance, and what equipment is used?" The following discussion should shed some light on techniques for testing two of the accuracy parameters important for ADCs: integral nonlinearity (INL) and differential nonlinearity (DNL). Although INL and DNL are not among the most important electrical characteristics that specify the highperformance data converters used in communications and fast data-acquisition applications, they gain significance in the higher-resolution imaging applications. However, unless you work with ADCs on a regular basis, you can easily forget the exact definitions and importance of these parameters. The next section therefore serves as a brief refresher course. INL and DNL Definitions DNL error is defined as the difference between an actual step width and the ideal value of 1LSB (see Figure 1a). For an ideal ADC, in which the differential nonlinearity coincides with DNL = 0LSB, each analog step equals 1LSB (1LSB = VFSR/2N, where VFSR is the full-scale range and N is the resolution of the ADC) and the transition values are spaced exactly 1LSB apart. A DNL error specification of less than or equal to 1LSB guarantees a monotonic transfer function with no missing codes. An ADC's monotonicity is guaranteed when its digital output increases (or remains constant) with an increasing input signal, thereby avoiding sign changes in the slope of the transfer curve. DNL is specified after the static gain error has been removed. It is defined as follows: DNL = |[(VD+1VD)/VLSB-IDEAL 1] | , where 0 < D < 2N 2. VD is the physical value corresponding to the digital output code D, N is the ADC resolution, and VLSB-

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

INL/DNL Measurements for High-Speed Analog-to-Digital Converters (ADCs)

Although integral and differential nonlinearity may not be the most important parameters for high-speed, high dynamic performance data converters, they gain significance when it comes to high-resolution imaging applications. The following application note serves as a refresher course for their definitions and details two different, yet commonly used techniques to measure INL and DNL in high-spe...

متن کامل

Bench Characterization of ADCs Using a Low-Cost PC-Based Data-Acquisition Board - Application Note - Maxim

This application note describes techniques of using a PC based Digital I/O Board to characterize analog-to-digital converters (ADCs). It will look at static DC parameters such as integral nonlinearity (INL), differential nonlinearity (DNL), gain, and offset errors, but also noise, internal reference voltage, and channel-to-channel coupling and matching, as well as the supply voltage dependence....

متن کامل

Systematic design and modelling of high-resolution, high-speed pipeline ADCs

This paper describes a suitable mathematical model for the design of high-speed, high-resolution pipeline ADCs. The effect of capacitor mismatch and finite amplifier bandwidth and gain on the converter INL and DNL are accurately modelled. On the basis of this model a design optimisation method is provided. 2005 Elsevier Ltd. All rights reserved.

متن کامل

Performance Testing of Logarithmic Analog- To-digital Converters

Abstract This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of convert...

متن کامل

Cumulative Differential Nonlinearity Testing of ADCs

This paper proposes a cumulative DNL (CDNL) test methodology for the BIST of ADCs. It analyzes the histogram of the DNL of a predetermined k LSBs distance to determine the DNL and gain error. The advantage of this method over others is that the numbers of required code bins and required samples are significantly reduced. The simulation and measurements of a 12-bit ADC show that the proposed CDN...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2012